| 摘要 |
PURPOSE:To test the inside of a circuit by mounting at least one of a test series-signal formation circuit enabling an output to the outside of the circuit and generating a digital output from a predetermined pattern or a test decision circuit, to which a prescribed pattern signal from the outside of the circuit is inputted and which compares with the pattern signal with a reference signal and decides it, and connecting each circuit. CONSTITUTION:The insides of integrated circuits contain a test series-signal formation circuit 1, a test object circuit 2 and a test-result decision circuit 3. The test circuits 1, 3 are used for testing the insides of the integrated circuits, an output from the test series signal formation circuit 1 outputting the serial or parallel series signal of the predetermined pattern is outputted to an output terminal 11 for the integrated circuits, and an input signal from an input terminal 10 is employed as an input to the test-result decision circuit 10. Consequently, the insides and outsides of the integrated circuits can be tested. The integrated circuit 21 with the test-series formation circuit 1 and the integrated circuit 23 with the test-result decision circuit 3 are used, and the integrated circuit 22 inserted between the circuits 21 and 23 is tested.
|
