发明名称 SURFACE DISPLACEMENT MEASURING INSTRUMENT
摘要 PURPOSE:To accurately measure the displacement quantity of the reflecting surface of, for example, an optical disk covered with a transparent layer without being affected by a transparent layer by setting the angle of incidence upon the surface of the transparent layer to the Brewster angle of the transparent layer. CONSTITUTION:Laser light LA 1 emitted by a light source 3 passes through a polarizing plate 5 to become a P polarized parallel light beam, which is incident on the optical disk 1 at an angle theta of incidence. When the angle theta is set to the Brewster angle of the transparent layer 2, the light LA 1 is not reflected by the layer 2, but enters the layer 2 and is reflected by the reflecting surface 1f. Its reflected light LA 2 is incident on a condenser lens 6 with focal distance (f). (A photodetecting element 7 composed of, for example, a two-dimensional image sensor arranged in the direction as shown by an arrow (x) is provided at the focus position of the lens 6 so that the photodetection surface is perpendicular to the optical axis. If the surface 1f slants by a fine angle delta, the light LA 2 slants by the angle 2delta, the spot position of incidence on the element 7 shifts. The element 7 sends out its (x)-directional and (y)-directional outputs which vary according to the displacement quantity of the element 7. Those measured values, distance (f), and angle theta are used to find the angle delta.
申请公布号 JPS62293103(A) 申请公布日期 1987.12.19
申请号 JP19860137033 申请日期 1986.06.12
申请人 NIKON CORP 发明人 OKI YASUSHI
分类号 H01L21/66;G01B11/00;G01C3/00;G01C3/06;G02B7/32;G03F7/20;G03F9/00;G11B7/26 主分类号 H01L21/66
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