发明名称 IC TEST PIN MOUNTING DEVICE
摘要 PURPOSE:To easily confirm logical values of respective pins of an IC to be measured by providing a means which display logical values of respective terminals of the IC to be measured. CONSTITUTION:The means which displays the logical values of the respective terminals of the IC 5 to be measured is provided. When a test pin 1 is at low level, a forward current flows to an LED 2, which illuminates to indicate that the pin 1 is at the low level. Then when the pin 1 is at high level, no current flows to the LED 2, which does not turns on, so it is known that the pin 1 is at the high level. Consequently, the logical value of the pin 1 of the IC 5 is easily confirmed.
申请公布号 JPS62289774(A) 申请公布日期 1987.12.16
申请号 JP19860134631 申请日期 1986.06.09
申请人 NEC IC MICROCOMPUT SYST LTD 发明人 NAKAYAMA ATSUSHI
分类号 G01R31/02 主分类号 G01R31/02
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