发明名称 METHOD FOR MEASURING FILM OF HEAT RESISTANT MATERIAL
摘要 PURPOSE:To calculate the thickness of a coating film comprising a heat resistant material in a non-destructive manner, by forming a corresponding calibration curve of a CT value obtained by the X-ray tomography of the thickness of a film formed when coating treatment is applied to a base material and a cut film thickness value and comparing the X-ray tomography CT value to the heat resistant material receiving coating treatment with the corresponding calibration curve. CONSTITUTION:A corresponding calibration curve is formed from a CT value obtained by the X-ray tomography of the thickness of a film formed when coating treatment is applied to a base material and a cut film thickness value and the X-ray tomography CT value to a heat resistant material receiving coating treatment is compared with the corresponding calibration curve to calculate the thickness of the coating film in a non-destructive manner. For example, from the pursuit result of the correlation between a coating thickness when silicon carbide is applied to the surface of a carbon crucible in a thickness of about 1.5-2.5mm and the CT value, the coating thickness of a measuring object can be obtained according to good correspondence relation capable of being given between both of them.
申请公布号 JPS62288509(A) 申请公布日期 1987.12.15
申请号 JP19860131117 申请日期 1986.06.07
申请人 TOSHIBA CERAMICS CO LTD 发明人 AIBA YOSHIRO;HASEBE NOBUHIRO;HAYASHI TATEO
分类号 G01N23/04;A61B6/00;A61B6/03;G01B15/02 主分类号 G01N23/04
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