| 摘要 |
A plurality of sample beam wavefronts derived from selected portions of a wide-aperture outgoing optical beam wavefront enter an entrance pupil (11) located adjacent a focal surface (12) on which the sample beams are individually focussed. A relay lens system (13) transmits the sample beams to a beam splitter (14), which divides each of the sample beams into an undeviated component and a diviated component. The undeviated components of the various sample beams image the entrance pupil (11) on a first scanning mirror (15), and the deviated components image the entrance pupil (11) on a second scanning mirror (16). The focal surface (12) is reimaged by the relay lens system (13) onto focal planes (17 and 18), respectively, so that the foci of the individual sample beams appear as spots on the focal planes (17 and 18). The scanning mirrors (15 and 16) are ditherable to sweep each of the sample bean spots across a plurality of maching rows of linear photodector arrays positioned at each of the focal planes (17 and 18). Line centroids of the various line images of the samle beam spots are calculated by the centroid processor (19) from quantitative measurements of the irraddiance distributions of the line images at the focal planes (17, and 18) This calculation, which can be performed continuously in real time, provides an indication of the form of the wide-aperture outgoing wavefront.
|
