| 摘要 |
PURPOSE:To determine the density of elements of components in an unknown sample accurately, by solving a simultaneous equation prepared by multiplying intensity data of characteristic X-ray for each of elements of components in an unknown sample as obtained by this measurement and intensity data of characteristic X-ray generated from each of all elements as obtained from a calibration measurement by the density of each element (unknown). CONSTITUTION:A wavelength scanning type X-ray spectroscope is used to measure and stare the intensity of X-ray at the wavelength position of characteristic X-ray for each of elements of all components in a sample with respect to a single sample of each of elements of one component in the sample. Such a calibration measurement is done for each of elements of all components beforehand. The X-ray intensity value of each of elements of respective components obtained at the wavelength position of characteristic X-ray of one element of components in the sample to be measured is multiplied by density value of each of elements of the components (unknown analysis value to be obtained) and the values obtained are totalized. An equation is prepared at a wavelength position of each of elements of all components to be measured in such a manner that the total thus obtained (a set value of X-ray intensity of each of elements of all components at the wavelength position of characteristic X-ray of elements of components to be measured) will be equal to the X-ray intensity measured at the wavelength position of characteristic X-ray of each of elements of components to be measured. The density of elements in the sample is calculated by solving the simultaneous equation thus prepared.
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