| 摘要 |
PURPOSE:To check the characteristic of a solid-state scanning element and to reduce the adjusting time by using plural test charts and using a pattern different from a 1st test chart as a 2nd test chart. CONSTITUTION:A light source 3 radiates the 1st test chart 11, its optical image is condensed by a lens 2 and formed on the solid-state scanning element 1. The 1st test chart 11 is fitted to a fixed test chart support 4 and the 2nd and 3rd test charts12, 13 are fixed by a test chart support 5 and moved to a direction of the arrow 8 by an actuator 6. The 1st test chart is used as a pattern for adjusting the position of the solid-state scanning element and a white color is used for the 2nd test chart. Thus, when the 2nd test chart is shown, uniform light is made incident on the solid-state scanning element 1. Thus, the solid-state scanning element is checked.
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