发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To contrive accomplishment of formation of high density of a memory device by a method wherein a read-out transistor is composed of a source and drain region, provided at a part of the control gate formed covering a floating gate, and a floating gate. CONSTITUTION:When electrons are being injected to a floating gate 3, the channel part 10 of a read-out transistor TR is inverted by the electric charge of said floating gate 3, and a current runs to the channel part 10, if potential difference is added between a bit wire and a word wire. Accordingly, a binary information can be memorized by detecting the above-mentioned current. Therefore, as a part of the control gate 7, which constitutes write-in transistor TR, constitutes the read-out transistor TR, both writing-in and read-out transistors can be arranged three-dimensionally, the area of a memory cell can be reduced to about one half, and the formation of high density memory storage can also be accomplished.
申请公布号 JPS62281370(A) 申请公布日期 1987.12.07
申请号 JP19860123241 申请日期 1986.05.30
申请人 NEC CORP 发明人 OKUZUMI TETSUYA;MINOWA MASAYUKI
分类号 H01L21/8247;H01L27/115;H01L29/78;H01L29/788;H01L29/792 主分类号 H01L21/8247
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