发明名称 |
Semiconductor image sensor and a method for fabricating same. |
摘要 |
<p>A plurality of light detection cells (19) are formed on a substrate (1) together with a charge-coupled device (CCD) connected to the detector cells for transferring and outputting electrical signal charges produced in the light detector cells. A first insulation layer (2) is formed on the substrate for isolating a patterned wiring (16-1, 16-2, 16'-1, 16'-2) of a peripheral portion of the CCD from the substrate and a second insulation layer (3) is formed on the substrate for isolating adjacent light detection cells from one another. The first insulation layer (2) has a thickness selected to withstand the voltage applied to the CCD portion whereas the second insulation layer (3) has a smaller thickness adapted to withstand a lower voltage applied to the picture cells. The narrower field isolation between picture cells allows a greater integration density of the picture cells.</p> |
申请公布号 |
EP0247942(A2) |
申请公布日期 |
1987.12.02 |
申请号 |
EP19870401187 |
申请日期 |
1987.05.26 |
申请人 |
FUJITSU LIMITED |
发明人 |
TAKEI, AKIRA 5-401, 150-4, HITORIZAWACHO;NISHIKAWA, TETSUO DAI-7-NAKAHARARYO, 528 |
分类号 |
H01L27/14;H01L27/148;H04N5/335;H04N5/369;H04N5/372 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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