| 摘要 |
PURPOSE:To economically test an LSI with a simple constitution by generating various logic patterns from a data ROM for the LSI to be tested. CONSTITUTION:The data ROM5 and a control ROM6 are mounted according to the kind of the LSI12 to be tested. Then, test data read out of the ROM5 is stored in one of an input/output data register 8, an input/output control data register 9, and a mask data register 10 by control data read out in a pair according to an address signal from an address counter. Then, input data is extracted from test data from the register 8 by test data from the register 9 and supplied to the LSI12. Output data from the LSI12, on the other hand, is compared with an expected value from the register 8 by a comparator 13 and so that the result is masked by a masking circuit 14 with mask data from the register 10. |
