发明名称 Ion microbeam apparatus
摘要 The invention is concerned with a power supply for the lens for fine adjustment among the beam-focusing lenses in an ion microbeam apparatus, and is concerned with the control thereof. In this ion microbeam apparatus, the power supply is provided for the lens for fine adjustment in addition to the power supply for the lens for rough adjustment. The power supply is served with a potential that so controls the beam as to have an optimum diameter, responsive to the signals from the ion beam detector and from the beam deflector means.
申请公布号 US4710632(A) 申请公布日期 1987.12.01
申请号 US19850733632 申请日期 1985.05.13
申请人 HITACHI, LTD. 发明人 ISHITANI, TOHRU;TODOKORO, HIDEO;KAWANAMI, YOSHIMI;TAMURA, HIFUMI
分类号 H01J37/12;H01J37/304;H01J37/317;(IPC1-7):H01J37/04;H01J37/10 主分类号 H01J37/12
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