| 摘要 |
PURPOSE:To improve the accuracy and efficiency of inspection by inspecting totally the entire surface of a plate type product which is conveyed in a constant direction by utilizing reflected light and detecting a defect which is detected insufficiently by an individual inspecting process. CONSTITUTION:Laser beam 2 is swept at right angles to the conveying direction of a tile 1 which has a curved part at its edge part and the surface defect is detected with a differential signal computed by a microcomputer based on photodetection signals outputted by cameras D1-D3 according to the surface state; and the defect at the curved part is decided 32 from a signal outputted by making reflected light transmitted through a screen 22 fixed above the tile incident on a photodetector 30, thus performing total inspection. Further, a colored spot which can not be detected by the total inspection is detected by detecting the light and shade of the surface color and brightness difference by a camera with a filter and a projection/recess defect is detected by detecting a slit pattern formed due to the disorder of inspection light projected through a slit. Further, the chipping of a side part is detected by projecting spot-shaped inspection light and detecting the disordered spot image by a camera to detect the presence of the chipping, thus completing the individual inspection.
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