发明名称 TESTING INSTRUMENT FOR PHOTOSEMICONDUCTOR ELEMENT
摘要 PURPOSE:To obtain a small-sized, inexpensive, and high-reliability instrument by providing a heat plate with many through holes, inserting photosemiconductors from one side and photodetecting elements from the other sides, and cooling the substrate units of the photodetecting elements. CONSTITUTION:The many through-holes 4a are bored in the head plate 4 in a box body 3, photosemiconductors provided to a detachable substrate unit 1 are inserted from one side of the holes 4a, and photodetecting elements provided to a substrate unit 2 are inserted from the other side. The unit 2 is provided with a measuring circuit part 5, the units 1 and 2 are connected by a cable 6a, and plural units 2 and a control part 7 are connected by a cable 6b to input and output a setting signal, driving signal, an output signal etc. Then, external air A is sucked in by an air cooling fan 3b and discharged from an opening 3c to cool the units 2, thus obtaining the small-sized, inexpensive, and high-reliability instrument for a high-temperature screen test, etc.
申请公布号 JPS62274274(A) 申请公布日期 1987.11.28
申请号 JP19860118839 申请日期 1986.05.23
申请人 CHINO CORP 发明人 HISHIKARI ISAO;INAGAKE DENJI;KOBAYASHI TADASHI;TAYA SHINICHI
分类号 G01R31/26 主分类号 G01R31/26
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