发明名称 TROUBLE-DETECTING CIRCUIT FOR MAGNET-DRIVEN TRANSISTOR
摘要 PURPOSE:To form a trouble-detecting circuit irrelevant to the number of drive transistors by providing diodes to interrupt the drive current of transistors for grouping, the first transistor to detect the action of transistors for driving, and the second transistor to control the base current. CONSTITUTION:A transistor 29 absorbs the base current of a transistor 27 through diodes 25 and 26 for grouping and the emitter and base of the transistor 27 from a power source V2 during the operation of magnet-driven circuits 14-19 by means of signals coming from a terminal G without the operation of transistors 5-10 and detects the trouble of transistors 11-13 for driving. Whereupon, the base of the transistor 27 is released. By the transistor 29 and the diode 25 and 26, the exertion of influences on the transistors 5-10 is prevented during the operation of the magnet-driven circuits. When detecting the trouble of the transistors 11-13, the transistors 27 and 28 are put into operation.
申请公布号 JPS62273858(A) 申请公布日期 1987.11.27
申请号 JP19860118512 申请日期 1986.05.23
申请人 FUJITSU LTD 发明人 YOSHINO SATOSHI;KAMATA AKINORI;ABE AKIHIRO
分类号 H03K17/62;B41J2/30;G01R31/00 主分类号 H03K17/62
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