| 摘要 |
PURPOSE:To simplify test operation and to reduce the test time by providing a storage circuit storing plural telephone numbers and outputting a dial signal corresponding to all the telephone numbers stored in the said storage circuit serially at the test. CONSTITUTION:Data having an address selected by a storage circuit 7 is converted into a dial signal of a telephone number corresponding to the stored data by a decoder 9 and a programmable counter 10 and the result is outputted from a DS terminal 49. A test signal goes to a high level at the test state by the combination of the states of input terminals 41-48, a signal of a prescribed period obtained by a frequency division circuit 2 passes through gates 12, 14 and becomes a basic signal fed to a station address of the storage circuit 7. The address of the storage circuit 7 is set similarly by the signal to the succeeding normal operation, a digit is selected and the data of the storage circuit is read. That is, in setting the test state, the input signal for each address command is not required and all the data in the storage circuit 7 are outputted.
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