| 摘要 |
PURPOSE:To inspect lead curvature as to many kinds of components by comparing the lead image of an electronic component with a standard lead image. CONSTITUTION:A component 1 to be inspected exits from a payoff stick 6 ad is then gripped by a component gripping device 2, lifted by a cylinder 3, and pressed against a plate 4 with constant pressure. The reverse surface of the plate 4 is covered with a translucent film 17 and irradiated by projectors 5 and 6 to form the silhouette image of a component lead 18 on the film 17. This silhouette image is picked up by a camera 7 and converted by a binary circuit 8 into a binary image, which is sent to a matching circuit 9. The circuit 9 fetches a dictionary (comparison pattern) 10 of each component shape and matches the dictionary 10 with the binary image by a specific comparing method. Consequently, it is decided 11 whether the component is normal or not and a lane switching part 12 is operated by a lane 13 to discharge the component to a conforming or nonconforming article discharge stick 14 or 15. The image signal as the dictionary 10 is optionally settable, so even when the shape of the component 11 changes, that is easily dealt with. |
