发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve the accuracy of alignment by a method wherein a mask for forming a source/drain diffused layer is used as a reference, a plurality of alignment patterns are formed in this mask, and subsequent mask patterns are superposed on the alignment patterns. CONSTITUTION:A means is adopted wherein a pattern as show in Fig. b' is superposed on a pattern formed as shown in Fig. a'. Moreover, a different shape is given for each mask alignment as patterns 1-8 of Figs. (a)-(d) so that positions of superposition can be discriminated distinctly according to shapes in a mask alignment process. These patterns 1-8 enables not only the mask alignment according to the outer side of a pattern, but also the mask alignment according to the inner side thereof, thus facilitating an operation for mask alignment and improving the accuracy of alignment.
申请公布号 JPS62271429(A) 申请公布日期 1987.11.25
申请号 JP19870078250 申请日期 1987.03.31
申请人 SEIKO EPSON CORP 发明人 KODAIRA MITSUHARU;HAYASHI KEIKO
分类号 G03F9/00;H01L21/027;H01L21/30;H01L21/68;H01L21/8238;H01L27/08;H01L27/092 主分类号 G03F9/00
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