| 摘要 |
The subject of the invention is a method making it possible to make spectral compensation in a semiconductor detector used in radiation meters and dosimeters employed in the nuclear field, characterised: - in that the utilisation comprises a discriminator whose threshold level is applied to the detector over a first determined length of time and is externally controlled by a preprogrammed system, - in that the various threshold levels and their respective time of application to the detector are determined by the nature of the detector used and by the tolerance allowed on the spectral response curve, - in that the measurements made for each threshold level are assigned a correcting coefficient determined by the nature of the detector unit and by the tolerance allowed on the spectral response curve. a
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