发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form fine dual gates, a space thereof is narrow, easily while improving characteristics by forming a slit pattern through electron beam exposure, evaporating an insulating material on the slit pattern and forming a pattern for separating the gates on an N type GaAs layer and shaping a gate metal pattern. CONSTITUTION:An N type Ga-As layer 2 is formed on a semi-insulating GaAs substrate 1, ohmic patterns 3,3' are formed on the layer 2, a resist 4 is applied on the patterns 3,3', and a slit pattern 5 for shaping gates is formed through electron beam exposure. SiO26 is evaporated and air gaps 8 are shaped on both sides of a pattern 7, and Au gate metal patterns 9,10 are formed to the air gap 8 sections through the electroplating of Au. When SiO26 and the pattern 7 for separation are removed through etching, the gate metal patterns 9,10 are separated completely to each other. Dual gates are completed by exfoliating the resist 4.
申请公布号 JPS609170(A) 申请公布日期 1985.01.18
申请号 JP19830117256 申请日期 1983.06.29
申请人 FUJITSU KK 发明人 YAMASHITA YOSHIMI;KOSEMURA KINSHIROU
分类号 H01L21/28;H01L29/80;(IPC1-7):H01L29/80 主分类号 H01L21/28
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