发明名称 Method and apparatus relating to specimen cells for scanning electron microscopes
摘要 Disclosed is an improved specimen cell for maintaining a scanning electron microscope specimen under nearly physiological conditions during observation when said specimen includes liquids having a relatively high vapor pressure. A cavity in the specimen cell mounts an open or closed specimen module which is scanned by the electron beam through a small aperture. During preparation of the electron microscope for observation, the aperture is closed by a door so as to prevent evaporation of liquids from the specimen. The door is mechanically or electronically opened to facilitate observation thus minimizing the exposure of the specimen to the desiccation and/or destructive vacuum effects. Furthermore, the aperture is sized so as to provide a resistance to vapor flow through the aperture while permitting bidirectional electron flow facilitating the electron microscopic observation of the specimen. In a further embodiment, an open specimen module is provided which can be replenished with liquid or fluid, which can be vibrated, raised and/or lowered and which can be heated or cooled as desired during observation of the specimen.
申请公布号 US4705949(A) 申请公布日期 1987.11.10
申请号 US19850802091 申请日期 1985.11.25
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF COMMERCE 发明人 GRIMES, II, JOHN W.;JENNINGS, HAMLIN;BROWN, PAUL W.
分类号 H01J37/20;(IPC1-7):G21K5/08 主分类号 H01J37/20
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