发明名称 |
Test probe for leadless devices |
摘要 |
An electrical test probe assembly for use with a leadless surface mounted device is provided which includes an array of resilient spring contacts in a pattern corresponding to the contacts of a leadless device. The array of spring contacts are configured to grip the peripheral edges of a surface mounted device, with each spring contact in biased engagement with a respective contact of the device.
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申请公布号 |
US4705333(A) |
申请公布日期 |
1987.11.10 |
申请号 |
US19850767809 |
申请日期 |
1985.08.21 |
申请人 |
PYLON COMPANY, INC. |
发明人 |
SICARD, STEPHEN T.;PEDRO, BRIAN A.;ALDEN, III, WAYNE S. |
分类号 |
G01R1/04;G01R1/073;H01R13/22;H05K13/08;(IPC1-7):H01R9/11;H01R23/02 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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