发明名称 TEST SYSTEM FOR COMPUTER SYSTEM
摘要 PURPOSE:To actualize a fault due to deterioration hard to find, to reduce a load on an operator, and to find the fault due to the deterioration in its early stage, by executing the same test program again by changing the margin of a computer system after completing an ordinary test. CONSTITUTION:After a process by an ordinary test method, a diagnostic process (SVP) control part 21 instructs the change of the margin within the tolerance of a host system 1 to the control part 31 of a power source control device 3. The control part 31, after instructing the change of the margin to a margin control part 32, changing the margin of the host system 1, and completing the change of the margin, informs the completion of the change of the margin to the SVP control part 21. Next, the SVP control part 21 instructs initialization to the host system 1. After the completion of the initialization of the host system 1, the SVP control part 21 reads out the same test program from an auxiliary storage device 4, and executes the test program similarly.
申请公布号 JPS62256049(A) 申请公布日期 1987.11.07
申请号 JP19860099993 申请日期 1986.04.28
申请人 NEC CORP 发明人 YAMAMOTO YOSHINORI
分类号 G06F11/24 主分类号 G06F11/24
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