发明名称 EXAMINATION APPARATUS
摘要 An inspection instrument having a generally elongated flexible shaft extending between a control head at a proximal end and an objective assembly at a distal end. A bending section adjacent the objective assembly enables movement of the objective assembly between a neutral position and angularly disposed positions. A control member on the control head causes deflection of the objective assembly by means of a pair of operating cables which are operatively connected at their opposite ends to the control member and to the objective assembly. A compensating mechanism engages the cables intermediate their ends and is effective to guard the cable against excessive loads and also to readily accommodate variations in the working length of the cables as occurs when the cables are permanently stretched.
申请公布号 JPS62254726(A) 申请公布日期 1987.11.06
申请号 JP19870062769 申请日期 1987.03.19
申请人 SAAKON CORP 发明人 JIYON RESURII WAADORU
分类号 A61B1/00;A61B1/005;G02B23/24 主分类号 A61B1/00
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