发明名称 ELECTRON BEAM TESTER
摘要 PURPOSE:To enable a measuring sample to prevent the charge up of an electron beam generation system by a released electron beam, by providing a device which inserts a shielding body between an electron gun and a measuring sample to shield electron beams when no measurement is done. CONSTITUTION:An electron beam 2 is made to irradiate a measuring sample 8 only for a measuring time and intercepted and absorbed by a metal plate 5 to be escaped to the ground 7 through a wire 6 when no measurement is done. With such an arrangement, the measuring sample 8 is allowed to receive the electron beam 2 for a short time only during the measurement, hence freed from the fear of being charged up. As there is no need for curving the electron beam 2, any of the electron beam 2 will not hit a blanking aperture 4 or the like, which by no means causes a charge up in a beam generation system. Since the metal plate 5 is used as shielding body and connected to the ground, no excess electric field is formed in the perimeter thereof.
申请公布号 JPS62247237(A) 申请公布日期 1987.10.28
申请号 JP19860066910 申请日期 1986.03.25
申请人 TOSHIBA CORP;TOSHIBA MICRO COMPUT ENG CORP 发明人 OKADA YOSHIO;SHIMIZU MITSURU;MATSUDA KOJI;OGIWARA MASAKI
分类号 G01N23/225;G01R19/00;G01R31/302 主分类号 G01N23/225
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