发明名称 Treatment of planarizing layer in multilayer electron beam resist
摘要 An improved electron beam resist structure comprises an organic planarizing layer which has been treated with an ion beam for a time sufficient to render it conductive and an electron beam resist layer thereover. The electron beam resist layer is preferably oxygen plasma resistant. When the resist layer is not resistant to oxygen plasma and it is desired to develop the planarizing layer by oxygen plasma, the structure additionally includes a thin hard mask layer, suitably of silicon dioxide, interposed between the conductive planarizing layer and the resist layer.
申请公布号 US4702993(A) 申请公布日期 1987.10.27
申请号 US19850802020 申请日期 1985.11.25
申请人 RCA CORPORATION 发明人 WHITE, LAWRENCE K.;BROWN, RICHARD
分类号 G03F7/09;H01L21/027;H01L21/311;(IPC1-7):G03C5/00;G03F7/26 主分类号 G03F7/09
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