发明名称 METHOD AND APPARATUS FOR REMOVING POSITIVE TYPE RESIST FILM
摘要 PURPOSE:To remove a positive type resist film effectively, by exposing the resist film in an oxygen gas atmosphere including ozone, and heating a substrate to a specified temperature or higher. CONSTITUTION:A treating chamber 1 comprising a vaccum container is provided with an inlet port 2 for oxygen gas including ozone and a gas exhaust port 3. In one wall surface of the chamber 1, a radiationray transmitting window 4 is provided. Infrared-ray lamps 5 provided with reflecting mirrors are arranged at the outside of the chamber 1. Infrared rays are emitted toward the back surface of a substrate 7 in the chamber 1 through the window 4. Heating temperature is controlled by a power source controller 6 for the infrared ray lamps. The oxygen gas including ozone is introduced into the chamber 1 through the port 2 at a specified flow rate from an ozonizer. With the substrate being exposed to an atmosphere including ozone, the substrate is heated with the irradiation from the infrared-ray lamp. Then, removal of a positive type resist film 9 is started, e.g., at about 370 deg.C of the substrate temperature.
申请公布号 JPS62245634(A) 申请公布日期 1987.10.26
申请号 JP19860089278 申请日期 1986.04.17
申请人 FUJITSU LTD 发明人 SHIN DAISHIYOKU
分类号 H01L21/30;G03C11/00;G03F7/00;G03F7/30;G03F7/40;H01L21/027;H01L21/302;H01L21/3065 主分类号 H01L21/30
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