发明名称 APPARATUS FOR MEASURING CHARACTERISTIC OF LASER DIODE
摘要 PURPOSE:To measure the far field pattern (FFP) of a laser diode (LD) within a short time, by mounting and holding a plural number of laser diodes at a predetermined pitch and providing an LD mount and a plurality of light receiving parts, etc. CONSTITUTION:Corresponding to the arrangement pitch (a) of LDs 10(10-1-10-n) arranged on an LD mount 2 at an equal interval, second and third light receiving parts 12, 13 are provided to a moving stand 9 at the same pitch (a). The center position 0 of a first light receiving part 11 comes to a position integer times the pitch (a) from the shape of a rail. The light receiving part 11 detects the FFP characteristic of LD10 and the light receiving part 12 detects the current-light output (I-L) characteristic of LD10 and the light receiving part 13 detects the spectrum characteristic of LD. By this method, FFP of LD can be measured within a short time and measurement can be performed continuously and working efficiency can be enhanced.
申请公布号 JPS62245128(A) 申请公布日期 1987.10.26
申请号 JP19860086055 申请日期 1986.04.16
申请人 ANRITSU CORP 发明人 MIYAO HIDETOSHI;ARAKI YUKIO;KAMEI HISAAKI
分类号 G01R31/26;G01J1/00;G01J1/42;G01M11/00 主分类号 G01R31/26
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