发明名称 STRUCTURE OF TEST SPRING
摘要 PURPOSE:To facilitate the troubleshooting of a cause to a fault by adopting a constitution that a monitor circuit section is connected at first when a plug is pulled into a contact pin and the main circuit section is cut off while the monitor circuit section is being connected when the plug is plugged into the final position. CONSTITUTION:The contact pin 6 is made of a metal having the elasticity and the main circuit section 61 is in contact with the center of a couple of counter pins 6 whose tip is formed as a sinusoidal wave, and plural pairs of pins 6 whose monitor circuit section 62 at the tip is opened are implanted to a base 7. A support section 83 made of a synthetic resin is projected to the pins 6 in pairs, a contact piece 82 made of a metal with excellent conductivity is provided along the support section 83, the plug 8 is formed the other end of the contact piece 82 while the terminal 84 is projected from the base 81 incorporatedly. In plugging the plug 8 from the direction of arrow into the guide hole 51 of a test spring 5, the contact piece 82 is in contact with the opening of the pin 6, the circuit section 62 is connected and monitored. In plugging the plug 8 up to the final position, the circuit section 61 is desconnected while the circuit section 62 is being connected.
申请公布号 JPS62243455(A) 申请公布日期 1987.10.23
申请号 JP19860087687 申请日期 1986.04.16
申请人 FUJITSU LTD;NIPPON TELEGR & TELEPH CORP <NTT> 发明人 KOJIMA SETSUO;YAMAMOTO TOSHIHIKO;HOSOGAI MASAO;IMORI YASUAKI;MAGAKI YOUTAROU;FURUKAWA TSUNEJI
分类号 H04M3/22 主分类号 H04M3/22
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