发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve the step coverage of an Al wiring and to upgrade the moisture resistance by a method wherein an SiO2 film formed by a decompression CVD method is used on the Al wiring as an interlayer insulating film and a silica coated film is formed on the SiO2 film. CONSTITUTION:An SiO2 glass film 103 of 6000Angstrom or more and 10000Angstrom or less is fomred on an Al wiring 102 as an interlayer insulating film by a decompres sion CVD method. A silica coated film 104 is formed on the glass film 103. Thereby, the step coverage of the Al wiring is improved and the moisture resistance is upgraded.
申请公布号 JPS62239549(A) 申请公布日期 1987.10.20
申请号 JP19860083023 申请日期 1986.04.10
申请人 SEIKO EPSON CORP 发明人 YAMADA MASAHIRO
分类号 H01L21/768;H01L21/316 主分类号 H01L21/768
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