发明名称 Process for forming MOS transistor with buried oxide regions for insulation
摘要 MOS process for forming field-effect devices in self-alignment with a buried oxide region. Oxygen is implanted in alignment with masking members after gates have been defined from the masking members. The masking members block the oxygen implantation and thus the channel regions of subsequently formed transistors are self-aligned with openings in the buried oxide layer.
申请公布号 US4700454(A) 申请公布日期 1987.10.20
申请号 US19850794524 申请日期 1985.11.04
申请人 INTEL CORPORATION 发明人 BAERG, WILLIAM;TING, CHIU H.;SIU, BYRON B.;TZENG, J. C.
分类号 H01L21/265;H01L21/762;H01L21/8238;(IPC1-7):H01L21/265;H01L21/16;H01L21/28;H01L21/316 主分类号 H01L21/265
代理机构 代理人
主权项
地址