发明名称 Semiconductor integrated circuit having overlapping circuit cells and method for designing circuit pattern therefor
摘要 The packing density of a logic LSI based on standard cell methodology is increased by partially overlapping two adjoining cells so as to have common terminal regions to be connected to the wirings for supplying power. To this end, the pattern of the terminal region at a side edge of the cells in the row direction is standardized in its shape, size and position in each cell. The cells are registered in the cell library of a CAD system, together with a newly introduced additional symbol to indicate the region which may be overlapped during chip design operation using a display.
申请公布号 US4701778(A) 申请公布日期 1987.10.20
申请号 US19850748599 申请日期 1985.06.25
申请人 FUJITSU LIMITED 发明人 ANEHA, NOBUHIKO;BABA, SHIGENORI
分类号 H01L21/82;H01L21/70;H01L27/02;(IPC1-7):H01L27/10;H01L23/50 主分类号 H01L21/82
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