发明名称 MEASURING APPARATUS FOR SEMICONDUCTOR
摘要 PURPOSE:To improve accuracy in aligning a projecting position and to simplify the structure and operation of a measuring apparatus, by a constitution wherein a cooling mechanism is driven for horizontal movement, rotation and the like, and the projecting position of light for a material to be measured is changed. CONSTITUTION:In a cooling mechanism, an attaching stage 5 for a material to be measured, and in addition, a temperature regulating heater 6 are connected to a cold head 4 of an He refrigerating machine 3. As a driving mechanism for driving the attaching stage 5 for the material to be measured, a Y-direction moving stage 8 is mounted on an X-direction moving stage 7. A rotary stage 11 is mounted thereon. On the surface of a material to be measured 17, a measur ing prober 18 is provided. A lifting mechanism 19 is set in a chamber. The change in material to be measured 17 is observed by using a microscope 22. Projected light 24 is reflected by a reflecting mirror 25 and projected on the material to be measured 17. When the measuring position of the material to be measured 17 is changed, the material to be measured 17 is driven by a driv ing device.
申请公布号 JPS62238635(A) 申请公布日期 1987.10.19
申请号 JP19860082858 申请日期 1986.04.10
申请人 SEMICONDUCTOR RES FOUND;JIESU:KK;OSAKA OXYGEN IND LTD;TOYO SANSO KK 发明人 NISHIZAWA JUNICHI;SHIBATA JIRO;TERASAWA YOSHIKAZU;YANAI MASAYOSHI;KAMIOKA YASUHARU
分类号 H01L21/66 主分类号 H01L21/66
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