发明名称 TEMPERATURE MEASURING METHOD FOR HIGH TEMPERATURE
摘要 PURPOSE:To measure the accurate temperature and emissivity of a high temperature body by calculating the temperature and emissivity of the high temperature body from a radiation expression in which the absorptivity of a particulate absorbing layer is considered by using calculated values of a particulate size distribution index and an optical layer thickness index, and the particulate distribution index and optical layer index. CONSTITUTION:For example, the absorption of a particulate absorbing layer is not considered and the emissivity values of the high temperature bodies corresponding to two previously selected wavelengths, e.g. lambdao and lambdaN among wavelengths lambdai are the same value epsilon'. On those conditions, wavelengths lambdai and the calculated degree of spectral radiation divergence are used to calculate the ratio epsilon'i/epsilon' of the emissivity epsilon' corresponding to the wavelengths lambdai (i=1,...N-1) except said two wavelengths and the emissivity epsilon' corresponding to the two wavelengths. Then, the particulate size distribution index gamma and optical layer thickness index beta of the particulate absorbing layer are calculated from the relational expression among the ratio epsilon'i/epsilon', gamma, and betaby using the calculated ratio epsilon'i/epsilon' corresponding to a measured value Ii. Lastly, the temperature T and emissivity epsilon of the high temperature body are calculated from the radiation expression based upon the calculated gamma and beta and the absorption rate exp(p-betalambda<r>i) of the particulate absorbing layer.
申请公布号 JPS62233729(A) 申请公布日期 1987.10.14
申请号 JP19860076458 申请日期 1986.04.04
申请人 ISHIKAWAJIMA HARIMA HEAVY IND CO LTD 发明人 TAGAMI ICHIZO
分类号 G01J5/00 主分类号 G01J5/00
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