发明名称 Apparatus for producing high quality epitaxially grown semiconductors
摘要 A high pressure furnace and reusable demountable containment means for selective in situ information of epitaxial layers on a semiconductor substrate while under gas overpressure. The containment means has vent means therein for allowing the inert and reducing or reactive gases in an inner chamber of the furnace to enter into the interior of the containment means to equalize pressures on each side of the housing and to semi-confine the vapor from the epitaxial growth source materials in the interior of the containment means. The containment means has a removable, i.e. demountable, form-fittedly sealed plug which is removed to insert the substrate and growth source elements, which are mounted in a close-space relationship on a support structure, therein. The support structure is inserted back into the containment means and the plug is form fittedly sealed thereto for performing the epitaxial layering.
申请公布号 US4699084(A) 申请公布日期 1987.10.13
申请号 US19820452673 申请日期 1982.12.23
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY 发明人 WILSON, HERBERT L.;GUITERREZ, WILLIAM A.
分类号 C30B23/02;C30B25/22;(IPC1-7):B05C9/14;F27B14/04 主分类号 C30B23/02
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