发明名称 DOWN LOAD CONTROL SYSTEM FOR MICRO TEST PROGRAM
摘要 PURPOSE:To execute the down load of all necessary micro test programs in a lump by providing a device program corresponding table to obtain a necessary program name in a host. CONSTITUTION:The operator of a work station 11 requests the down load of a micro test program to a host 13 in order to test the device of device numbers DV-A-DV-D. The host 13 refers to a device program corresponding table 14 in accordance with the down load request and obtains a micro test program corresponding to the device numbers DV-A-DV-D. Next, from a micro test program library 14, individual equivalent micro programs are retrieved and respective programs are down-loaded to the work station 11. Thus, all necessary micro test programs can be down-loaded in a lump.
申请公布号 JPS62231342(A) 申请公布日期 1987.10.09
申请号 JP19860073277 申请日期 1986.03.31
申请人 PFU LTD 发明人 KIDA TETSUYA;SHIMAZAKI AKIHIRO
分类号 G06F9/24;G06F9/22;G06F11/22 主分类号 G06F9/24
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