| 摘要 |
1. Method for the photogrammetrical measurement of an object with at least one optoelectrical solid-state image sensor whose image area is smaller than that of the desired whole image, wherein the photogrammetrical imaging system includes the point area of a grid covering the whole image, e.g. a glass plate with suitable point markings distributed in raster fashion, and the image sensor is arranged in the imaging space in such a way that in each case it images at least one unit of the grid, converging the area in the sensor image, wherein the grid points imaged in the digital partial image of the image sensor are adjusted to their nominal position in the scanning grid and the resulting transformation parameters are used to convert the partial image to a unitary whole image system, wherein the image sensor is disposed behind the camera grid disposed in the image plane of the survey camera, so that the camera grid and the photographic object can be projected onto a sensor surface, and wherein the image sensor is displaced from one grid unit to the next for continuous surveying, characterized in that optical separation of object and grid takes place by double exposure, wherein first the grid point are imaged by the image sensor under separate, external lighting without the object information being visible, the resulting first sensor image is stored digitally, and then the object having the same geometrical relationship to the grid is imaged and the resulting second sensor image is also stored digitally. |
