发明名称 REMOTE TEST CONTROL SYSTEM
摘要 PURPOSE:To make the remote test efficient without decreasing the number of message channels by providing additionally an idle line retreival circuit, a data link bit insertion circuit to a master station and a data link bit separation circuit and a data link bit decode circuit to a slave station, respectively. CONSTITUTION:The idle line retreival circuit 22 of the master station A uses a signaling bit in a transmission multiplex signal to detect an idle line and the line number is informed to a test signal insertion circuit 21, a data link bit insertion circuit 23 and a test result separation circuit 24. The circuti 21 inserts the test signal into an idle channel time slot in the multiplex signal. The circuit 23 inserts the idle line number and the control signal to a data link bit. The data link bit separation circuti 25 of a slave station B separates the said bit, a data link bit decode circuit 26 separates the idle line number and the control signal, the former is fed to a test signal separation circuti 27 and a test result insertion circuit 28, and the latter is outputted from a terminal 23. The circuit 27 separates the test signal from the said idle line and outputs the result to the line to be tested. The test result signal is inserted to the designated time slot by the test result insertion circuit 28.
申请公布号 JPS62226734(A) 申请公布日期 1987.10.05
申请号 JP19860068594 申请日期 1986.03.28
申请人 NEC CORP 发明人 HAYASHI KENJI
分类号 H04J3/14 主分类号 H04J3/14
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