发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 <p>PURPOSE:To perform a correct reading test in a verify mode by providing a discharge circuit for discharging a charge stored in the stray capacity of a data line while the writing operation is completed and the verify mode is started in the data line or a common data line. CONSTITUTION:In order to realize the verify mode of high reliability, the MOSFETQ 16 of N channels is provided between the input terminal of a sense amplifier SA and the earth potential of the circuit. An internal timing signal Vr is supplied to the gate of this MOSFETQ 16. Accordingly, the MOSFETQ 16, while the internal timing signal Vr goes to a high level, namely immediately after the writing to a memory cell is completed, is turned on during the delay time td of a delay circuit and discharges the charge of the stray capacity Cf of the data line D1 through the common data line CD.</p>
申请公布号 JPS62223898(A) 申请公布日期 1987.10.01
申请号 JP19860065678 申请日期 1986.03.26
申请人 HITACHI LTD 发明人 FURUNO TAKESHI;FUKUDA MINORU;MATSUNO YOICHI
分类号 G11C17/00;G11C16/02;G11C16/06;G11C29/00;G11C29/12 主分类号 G11C17/00
代理机构 代理人
主权项
地址