发明名称 |
Semiconductor strain gauge bridge circuit. |
摘要 |
<p>A semiconductor strain gauge bridge circuit device is disclosed to include a bridge circuit (2) of semiconductor strain gauges, a first zero-point temperature compensation circuit (3) connected to one (b) of a pair of output terminals of the bridge circuit and including a voltage-dividing resistor circuit (RZ1, RZ2) generating a voltage substantially equal to a potential appearing at the one output terminal at a predetermined temperature, and a second zero-point temperature compensation circuit (4) connected to the other (d) of the output terminals and including a resistive element (RZTH) having a temperature characteristic similar to that of the semiconductor strain gauges.</p> |
申请公布号 |
EP0239094(A2) |
申请公布日期 |
1987.09.30 |
申请号 |
EP19870104402 |
申请日期 |
1987.03.25 |
申请人 |
HITACHI, LTD. |
发明人 |
MIYAZAKI, ATSUSHI;KOBAYASHI, RYOICHI |
分类号 |
G01B7/00;G01B7/16;G01D3/028;G01L1/22;G01L9/00;G01L9/06;H01L41/00 |
主分类号 |
G01B7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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