| 摘要 |
PURPOSE:To enable analysis of a high-temp. sample with the analysis accuracy of about the same degree as in the case of analyzing an ordinary-temp. analytical sample by subjecting the component analysis value at a standard temp. from the temp. information of the analytical sample to correction. CONSTITUTION:The temp. value measured by a temp. detecting end 9 embedded into the part nearest an electric discharge part (p) of a light emission stand fixing board 2 and a thermometer 10 is first taken via an analog-to-digital converter 11 into a data processor 8 by the instruction signal from the data processor 8. A spark discharge is thereafter generated between the analytical sample 3 and a counter electrode 4 by a light emitting device 1 and after the light obtd. by the spark discharge is separated to spectra by a spectroscope 6; thereafter, the analysis value of the analytical component is calculated by the data processor 8 which takes the output of a light intensity detector 7 therein. The 2nd time of the measured sample temp. value is finally taken again into the data processor 8 by the similar procedure and the analysis value of the analytical component is corrected by the average value of the 1st and 2nd measured sample temp. values.
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