发明名称 SIGNAL AMPLITUDE MEASURING INSTRUMENT
摘要 PURPOSE:To view the amplitude of a signal instantaneously at a desired measurement point by latching the analog/digital conversion output of a signal to be measured when a measurement point signal is outputted, and varying it to a display value which can be viewed. CONSTITUTION:When a bipolar signal is inputted, a waveform shaping circuit 1' outputs an enable pulse and a rectified signal in synchronism with the leading of the bipolar signal. The rectified signal is supplied to an analog/digital converter 2, which outputs an amplitude digital value in response to a sample clock. A latch clock generating circuit 3', on the other hand, generates a latch clock in synchronism with the enable pulse from the waveform shaping circuit 1' and the sample clock and a latch circuit 4' latches the current digital value, so that the display value which can be viewed is outputted through an output means 5.
申请公布号 JPS62220871(A) 申请公布日期 1987.09.29
申请号 JP19860063574 申请日期 1986.03.20
申请人 FUJITSU LTD 发明人 FURUKAWA YUKIO
分类号 G01R19/04 主分类号 G01R19/04
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