发明名称 FLATNESS MEASURING INSTRUMENT
摘要 PURPOSE:To measure flatness at a narrow place by fitting one or >=2 position detectors to a base body having a reference plane and moving this reference plane in a contact state with the surface to be measured. CONSTITUTION:Position sensors 3A, 3B, 3C and 3D are distributionally provided to the base body 1 and respective tips are provided with probes 4A, 4B, 4C and 4D. The reference plane 2 of the base body 1 is in contact with the surface 6 to be measured of an object 5 to be measured and the base body 1 is moved extending over a prescribed area on the object 5 to be measured together with the position sensors 3A, 3B, 3C and 3D as the contact state is maintained. The position sensors 3A, 3B, 3C and 3D are moved on the surface 6 to be measured and a maximum value of intervals between the reference plane 2 and the surface 6 to be measured detected at the respective positions indicates the flatness.
申请公布号 JPS62220806(A) 申请公布日期 1987.09.29
申请号 JP19860065336 申请日期 1986.03.24
申请人 FUJI ELECTRIC CO LTD 发明人 TSUDA KIICHIRO;KURIYAMA YUSUKE
分类号 G01B7/34;G01B7/00;G01B21/30 主分类号 G01B7/34
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