发明名称 Method for measuring dimensions of fine pattern.
摘要 <p>A method of measuring the dimensions of a fine pattern, comprising: detecting (step 705) a surface area and a profile of a displayed pattern image, detecting (707) the center of gravity of the pattern image, calculating (709) an equivalent diameter of a circular pattern having the same surface area as the pattern image, determining (7l3) a mean value of pattern lengths of lines which pass through the center of gravity of the pattern image and which intersect the pattern image at two intersecting points, and comparing (7l5) the mean value with the equivalent diameter of the pattern image. The pattern lengths are defined as distances between the two intersecting points. </p>
申请公布号 EP0238247(A1) 申请公布日期 1987.09.23
申请号 EP19870302042 申请日期 1987.03.10
申请人 FUJITSU LIMITED 发明人 MATSUI, SHOUGO;KOBAYASHI, KENICHI
分类号 G01B11/02;(IPC1-7):G01B11/00 主分类号 G01B11/02
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