发明名称 APPARATUS FOR INSPECTING PRINTED CIRCUIT BOARD
摘要 PURPOSE:To attain to shorten a processing time, by processing the both surface image information of a printed circuit board obtained by an image pickup part to make it possible to inspect the parts provided to the front surface of the board and the parts provided to the back surface thereof. CONSTITUTION:An image pickup part 13 is equipped with upper and lower cameras 32, 34 and upper and lower illumination devices 33, 35 and the images of the front and back surfaces of a printed circuit board to be inspected are picked up by the cameras 32, 34 and the obtained image signals are sent to a processing part 14. The processing part 14 extracts the parameters of reference parts 11-1a-11-na from the upper and lower side image signals on a reference printed circuit board 10-1 at the time of a teaching mode to form a judge file. Next, at the time of an inspection mode, the processing part 14 extracts the parameters of the parts 11-1b-11-nb of the printed circuit board 10-2 to be inspected to form a data file to be inspected. Both files are compared and the detachment and positional shift of the parts 11-1b-11-nb are inspected.
申请公布号 JPS62215855(A) 申请公布日期 1987.09.22
申请号 JP19860059694 申请日期 1986.03.18
申请人 OMRON TATEISI ELECTRONICS CO 发明人 MIYAKE TAMIO
分类号 G01N21/88;G01N21/93;G01N21/956;H05K13/08 主分类号 G01N21/88
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