发明名称 READING CIRCUIT FOR SEMICONDUCTOR NON-VOLATILE MEMORY
摘要 <p>PURPOSE:To take out a large output voltage variation though a variation of threshold of a non-volatile memory is small, by driving an MOS transistor TR with the sourc side of the non-volatile memory. CONSTITUTION:A P type MOSTR11 is driven by a non-volatile memory 12 whose drain is set to an earth potential; and if a floating gate electrode of the memory 12 is not electrostatically charged with electrons, a prescribed source current is flowed through a power source voltage VDD, and a corresponding read voltage Vout is outputted. Meanwhile, if the floating gate electrode is electrostatically charged, the source current is hardly flowed, and the corresponding voltage Vout is generated. Consequently, a read output where the voltage is varied greatly in accordance with electrostatic charge or non-electrostatic charge of the floating electrode corresponding to stored contents is taken out though a variation of threshold of the non-volatile memory is small, and thus, a stable read of less variation of the output voltage is performed.</p>
申请公布号 JPS6038799(A) 申请公布日期 1985.02.28
申请号 JP19830147105 申请日期 1983.08.11
申请人 SEIKO DENSHI KOGYO KK 发明人 HAYASHI YUTAKA;KAMIYA MASAAKI;KOJIMA YOSHIKAZU;TANAKA KOJIROU
分类号 H01L27/112;G11C16/04;G11C16/26;G11C17/00;H01L21/8246;H01L21/8247;H01L27/10;H01L29/788;H01L29/792;H03K19/0944 主分类号 H01L27/112
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