发明名称 PROCESS OF PEELING OFF RESIST
摘要 PURPOSE:To completely peel off a resist formed of a denatured layer thereon using ion implanted mask without doing damage to a substrate making use of plasma by a method wherein plasma processing is performed using reactive gas such as O2 etc. while cooling down the substrate. CONSTITUTION:For example, phosphorus ion (P<+>) of a dosage 3X10<15>cm<-2> is implanted with accelerating energy of 120KeV so that a substrate 9 coated with resist 1.3mum thick formed of a denatured layer thereon may be fixed on cooling susceptors 4 cooled down by cooling water fed from a cooling water supply pipe 3a (serving both as a strut). Next, oxygen (O2) is fed from a reaction gas leading-in port 5 to a reaction vessel 1 at the flow rate of around 500cc/min to be exhausted from an exhaust port 6 to reduce the pressure in the reaction vessel 1 down to around 1Torr and then high frequency electrodes 7a, 7b are impressed with high frequency power of around 13.56MHz, 1.5KW to produce oxygen plasma in the reaction vessel 1 for peeling off the resist on the substrate 9 to be processed for 3-5min. Through these procedures, the resist layer on the substrate to be processed can be completely peeled off leaving no denatured layer at all.
申请公布号 JPS62208636(A) 申请公布日期 1987.09.12
申请号 JP19860030327 申请日期 1986.02.14
申请人 FUJITSU LTD 发明人 FUJIMURA SHUZO;MOTOKI YASUNARI;KATO YOSHIKAZU
分类号 H01L21/30;G03F7/42;H01L21/027;H01L21/302;H01L21/306;H01L21/3065;H01L21/312 主分类号 H01L21/30
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