发明名称 INSPECTING METHOD FOR PARTS MOUNTING SUBSTRATE
摘要 PURPOSE:To inspect parts whose color is similar to a color of an elementary substrate, as well, with regard to its existence and position shift, etc., by bringing a parts mounting substrate which has colored one of parts or the elementary substrate to a green system, a red system or a yellow system, to an image pickup processing. CONSTITUTION:As for a printed board 25-1, for instance, parts 28-1-28-n of other color than yellow or an achromatic color are placed on an elementary substrate 27 which is colored in yellow. An image pickup part 16 illuminates the board by a white ring illuminating device 30, and outputs a green primary color image signal and a blue primary color image signal from a monochromatic TV camera 29, by using a green filter 38-a and a blue filter 38-b. These image signals are converted to a green-blue subtraction video signal by a processing part, and also, based on this subtraction video signal, a feature parameter of the parts 28-1-28-n is extracted. By comparing this feature parameter with a reference parameter which is extracted with regard to a reference printed board, whether a printed board to be inspected is good or not is decided.
申请公布号 JPS62207938(A) 申请公布日期 1987.09.12
申请号 JP19860049546 申请日期 1986.03.08
申请人 OMRON TATEISI ELECTRONICS CO 发明人 KOBAYASHI SHIGEKI;UTSUNOMIYA SHUNJI
分类号 G01N21/88;G01N21/93;G01N21/956;G06K9/00;G06T1/00;H05K13/08 主分类号 G01N21/88
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