发明名称 THERMAL CONDUCTIVITY MEASURING INSTRUMENT
摘要 PURPOSE:To stably calculate with high accuracy the thermal conductivity of an object to be measured, by giving a temperature difference to a part of the object to be measured and its periphery, and measuring a temperature distribution which is generated thereby. CONSTITUTION:An object to be measured 1 is supported by a sample supporting base 3, a sample retaining plate 2, and a set-screw 5, and a means for generating a temperature difference between a part of the object to be measured and the periphery of the object to be measured, for instance, a heater 4 being a heating source is made to contact to the sample supporting base 3. Heat by such a heater 4 is brought to conduction heating to both ends of the object to be measured 1 through the sample supporting base 3, and a temperature distribution is generated in the longitudinal direction (x direction) of the object to be measured 1. As for the temperature distribution in the longitudinal direction of the object to be measured 1, the effect of a conduction from the object to be measured 1 to an atmosphere and the convection of the atmosphere can be disregarded, by holding the inside of a vacuum container 6 in a high vacuum exceeding 1X10<-1>Torr. The temperature distribution of the object to be measured 1 is measured by a non-contact temperature measuring means 9 through an optical window 8.
申请公布号 JPS62207944(A) 申请公布日期 1987.09.12
申请号 JP19860051660 申请日期 1986.03.10
申请人 AGENCY OF IND SCIENCE & TECHNOL;SEIKO INSTR & ELECTRONICS LTD 发明人 ONO AKIRA;BABA TETSUYA;FUNAMOTO HIROYUKI;NISHIKAWA AKIRA
分类号 G01N25/18 主分类号 G01N25/18
代理机构 代理人
主权项
地址