发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain an aperture whose cross-sectional form is gentle, by coating the upper surface of a body on which a hole is made with an etching-assisting layer such as SOG, and setting the etching speed of the body on which a hole is made so as to be lower as compared with the etching-assisting layer and photo resist for filling. CONSTITUTION:A PSG layer 2 is formed on an Si substrate 1 and a spin-on- glass (SOG) layer 3 is coated thereon. On the layer surface, photo resist 4 is coated, which is provided with a window 5. When RIE is applied, a penetrating hole 6 is formed in the SOG layer and the PSG layer, while the Si substrate is hardly subjected to etching. The formed hole is filled with photo resist 7, and subjected to an isotropic dry etching. The etching progresses quickly in the SOG and the photo resist, so that the PSG which neighbors their boundary surfaces is exposed in the etching atmosphere and the etching progresses also therefrom. Then the etching is interrupted and the remaining photo resist is exfoliated. Thereby, a contact hole possessing a gentle cross-sectional shape is formed.
申请公布号 JPS62205628(A) 申请公布日期 1987.09.10
申请号 JP19860049020 申请日期 1986.03.06
申请人 FUJITSU LTD 发明人 YOSHINAMI MUTSUO
分类号 H01L21/302;H01L21/3065 主分类号 H01L21/302
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