发明名称 PSEUDO CALL TEST SYSTEM
摘要 PURPOSE:To shorten the time of the measurement of quality stability of a connected channel by collating received digital pattern information with the sent information. CONSTITUTION:When an outgoing circuit 11 and an incoming circuit 14 are connected via an exchange 2 to be tested, optional digital pattern information from a control circuit 12 is modulated by the outgoing circuit 11 and the result is sent to the connected channel as an analog signal. The digital pattern information via the connected channel comes to the incoming circuit 14, then is subjected to A/D conversion and sent to the control circuit 12, the sent digital pattern information and the received digital pattern information are collated by a collation circuit 13, where the quality of connection is evaluated.
申请公布号 JPS62204653(A) 申请公布日期 1987.09.09
申请号 JP19860046131 申请日期 1986.03.05
申请人 HITACHI LTD 发明人 IWAMOTO MAKOTO;OZAKI RIKUO
分类号 H04M3/26 主分类号 H04M3/26
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